Tag: Piezoelectric Inertia Drives

Precision Positioning of Samples and Objectives

The Key to Successful Microscoping

Whether classical stereo microscopy, fluorescent, widefield or laser scanning microscopy, whether SEM, FIB-SEM, TEM, AFM or correlative microscopy - positioning samples and objectives with subnanometer precision is decisive for the quality of your results with all of these techniques. This fully clickable, new “Nanopositioning for Microscopy” brochure provides a comprehensive overview of objective scanners and sample stages with up to six degrees of motion freedom – illustrated by a variety of today’s microscopy techniques.

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Setting up and Adjusting a Fluorescent Microscope for Reliable Examination Results

PI Supports the GATTAscope Project

The GATTAscope uses the TIRFM process to capture meaningful images thanks to high-precision positioning of the sample with stages and controllers from PI - find out how in this article.

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