Category: Imaging & Microscopy

If you can Measure it, we can Help you Optimise it

System Optimisation – Tracking and Alignment in Multiple Degrees of Freedom


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Quantitative Measurement of Protein Dynamics with High Linearity Atomic Force Spectrometer


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How Active Alignment Technology Speeds Up Manufacturing of Optical Systems


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Super-Resolution Optical Microscopy, Nanoscopy, and Nanopositioning Motion Control


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Hexapod for Non-Contact Asphere Metrology

A novel non-contact metrology method called “Tilted Wave Front Interferometry (TWI)” makes use of the multi-axis flexibility and accuracy of hexapod parallel kinematics 6-axis motion systems to position a calibration sphere.


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